\nThe SBR-02 is based on the rotational polarizer method used in ellipsometers. The optical system is almost the same as that of the SBR-01, but by rotating the polarizer on the light source side, the birefringent phase difference and the principal axis orientation of the sample can be determined simultaneously.
![\"SBR02\"](\"https:\/\/uniopt.co.jp\/wp-content\/uploads\/2014\/05\/SBR02.jpg\")
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| <\/td> | Specification<\/th> | Retardation<\/th> | Azimuth of axis<\/th>\n<\/tr>\n<\/thead>\n |
|---|---|---|---|
| Measurement performance<\/td> | Resolution<\/td> | 0.1 deg. (0.2 nm at 633 nm)<\/td> | 0.1 deg.<\/td>\n<\/tr>\n |
| Range<\/td> | 0 - 85 deg. \n(0 - 150 nm at 633 nm)<\/td> | \u00b1 90 deg.<\/td>\n<\/tr>\n | |
| Measurement time<\/td> | Appx. 3 sec. \/ point<\/td>\n<\/tr>\n | ||
| Optical system<\/td> | Principle of Measurement<\/td> | Rotating polarizer method<\/td>\n<\/tr>\n | |
| Source<\/td> | He-Ne laser (\u03bb=632.8 nm) \nOther wavelengths are available as an option.<\/td>\n<\/tr>\n | ||
| Sample stage \n<\/td> | Folding<\/td> | To be discussed separately(Standard scanning range : < 50 x 50 nm ) \nThe orientation of the main axis of the sample must be known (fixed orientation).<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/li>\n<\/ol>\n \n <\/p>\n","protected":false},"excerpt":{"rendered":" Overview The SBR-02 is based on the rotational polarizer method used in ellipsometers. The optical system is a … Continue reading |