{"id":2077,"date":"2021-04-22T11:33:54","date_gmt":"2021-04-22T02:33:54","guid":{"rendered":"http:\/\/uniopt.co.jp\/?page_id=2077"},"modified":"2021-05-10T18:22:53","modified_gmt":"2021-05-10T09:22:53","slug":"sbv","status":"publish","type":"page","link":"https:\/\/uniopt.co.jp\/en\/catalog\/birefringence\/sbv\/","title":{"rendered":"SBV"},"content":{"rendered":"<p><!--:ja--><\/p>\n<hr \/>\n<p>The birefringence observer SVB is designed for simple observation of the distribution and irregularity of birefringence of a sample.<br \/>\nAlthough it cannot be used for quantification, it can be used for sorting out good and bad samples in manufacturing and inspection.<\/p>\n<ul>\n<li><a title=\"SVB-01\" href=\"https:\/\/uniopt.co.jp\/en\/catalog\/birefringence\/sbv\/svb-01\/\">Birefringence Observer (SBV-01)<\/a><\/li>\n<li><a title=\"SBV-20\" href=\"https:\/\/uniopt.co.jp\/en\/catalog\/birefringence\/sbv\/sbv-20\/\">Semiconductor wafer defect observer (SBV-20)<\/a><\/li>\n<\/ul>\n<hr \/>\n<p><!--:--><\/p>\n","protected":false},"excerpt":{"rendered":"<p>The birefringence observer SVB is designed for simple observation of the distribution and irregularity of bire &hellip; <a href=\"https:\/\/uniopt.co.jp\/en\/catalog\/birefringence\/sbv\/\">Continue reading <span class=\"meta-nav\">&rarr;<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":2049,"menu_order":3,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"http:\/\/www.uniopt.co.jp\/?page_id=433","footnotes":""},"class_list":["post-2077","page","type-page","status-publish","hentry","en-US"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2077","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/comments?post=2077"}],"version-history":[{"count":2,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2077\/revisions"}],"predecessor-version":[{"id":2394,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2077\/revisions\/2394"}],"up":[{"embeddable":true,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2049"}],"wp:attachment":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/media?parent=2077"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}