{"id":2083,"date":"2021-04-22T11:35:37","date_gmt":"2021-04-22T02:35:37","guid":{"rendered":"http:\/\/uniopt.co.jp\/?page_id=2083"},"modified":"2021-05-10T18:37:50","modified_gmt":"2021-05-10T09:37:50","slug":"sbv-20","status":"publish","type":"page","link":"https:\/\/uniopt.co.jp\/en\/catalog\/birefringence\/sbv\/sbv-20\/","title":{"rendered":"SBV-20"},"content":{"rendered":"<p><!--:ja--><\/p>\n<hr \/>\n<p>Semiconductor wafer defect observer (SBV-20) <a href=\"https:\/\/uniopt.co.jp\/wp-content\/uploads\/2014\/05\/sbv20.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-460 size-full\" src=\"https:\/\/uniopt.co.jp\/wp-content\/uploads\/2014\/05\/sbv20.jpg\" alt=\"sbv20\" width=\"227\" height=\"202\" \/><\/a><\/p>\n<hr \/>\n<ol>\n<li>Overview<br \/>\nDefects occur in semiconductor crystals when the crystal orientation is slightly shifted during pull-up. The defect observer is designed for easy inspection of these defects. It is best suited for inspection of wafers that transmit visible light, such as lithium niobate crystals. It can also be used as an experimental device for photoelasticity.<\/p>\n<hr \/>\n<\/li>\n<li>Specifications\n<ul>\n<li>Polarizer \uff1a150 mm in dimeter<\/li>\n<li>Observation area\uff1a 140 mm in dimeter<\/li>\n<li>Ovservation method\uff1aCross-micol method, circular polarization method, and other combinations area available.<\/li>\n<\/ul>\n<\/li>\n<\/ol>\n<hr \/>\n<p><!--:--><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Semiconductor wafer defect observer (SBV-20) Overview Defects occur in semiconductor crystals when the crystal &hellip; <a href=\"https:\/\/uniopt.co.jp\/en\/catalog\/birefringence\/sbv\/sbv-20\/\">Continue reading <span class=\"meta-nav\">&rarr;<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":2077,"menu_order":1,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"http:\/\/www.uniopt.co.jp\/?page_id=459","footnotes":""},"class_list":["post-2083","page","type-page","status-publish","hentry","en-US"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2083","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/comments?post=2083"}],"version-history":[{"count":2,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2083\/revisions"}],"predecessor-version":[{"id":2398,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2083\/revisions\/2398"}],"up":[{"embeddable":true,"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/pages\/2077"}],"wp:attachment":[{"href":"https:\/\/uniopt.co.jp\/wp-json\/wp\/v2\/media?parent=2083"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}