Uniopt Co.,Ltd.
Light as the measurement probe
Skip to content
Home
Company
Description of business
History
Group, Partners
Products
Birefringence
ABR
ABR-10A
ABR-22
ABR variation
ABR data example
SBR
SBR-01
SBR-02
SBR-03
SBV
SVB-01
SBV-20
High spatial resolution
VectMAP
Photoelastic constant measurement
Striae viewer
Auto stage
Large area scanning microscope
Plant monitoring system
Dual-view lens for C-mount camera
Custom made
Education
Optical measurement kit
Poincare sphere ~paper-craft~
Refractive index measurement equipment
(日本語) パネル特性評価・輝度測定装置
Catalog Download
Measurement service
Retardation
Photoelastic constant
Available service
Measurement example
Abnormal profile sample
Photoelastic constant measurement method
Large scale block
Optical cell
Optical disk
Liquid crystal device
Rubbing film 1
Rubbing film 2
Rubbing film 3
Rubbing film 4
Rubbing film 5
Rubbing film 6
Measurement sample list
R&D
Conference presentation
Paper, journal
Explanation
What birefringence is
Optical heterodyne interferometry
Birefringence measurement using the optical heterodyne interferometry
Q&A
Links
Contact us
Access
Technical data
LaTex install for Mac OS 10.10 yosemite
ABR variation
Sorry, this entry is only available in
Japanese
.
Search for:
Recent Posts
(日本語) 学会発表のお知らせ
(日本語) 夏季休暇のお知らせ
(日本語) 学会発表のお知らせ -終了しました-
(日本語) 年末年始休暇のお知らせ
(日本語) 応用物理学会秋季学術講演会出展 -終了しました-
Archives
August 2018
July 2018
March 2018
December 2017
August 2017
July 2017
March 2017
February 2016
December 2015
July 2015
June 2015
January 2015
November 2014
October 2014
August 2014
June 2014
カテゴリ
Company
Products
(日本語) パネル特性評価・輝度測定装置
Measurement service
Measurement example
R&D
Explanation
Q&A
Links
Contact us
Access
Technical data
Language:
日本語
English
Back to Top ↑
